用模拟退火法确定MgF2薄膜折射率和厚度

郭春; 李斌成

doi:10.3788/OPE.20132104.0858

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用模拟退火法确定MgF₂薄膜折射率和厚度

现代应用光学 | 更新时间：2020-08-12

- 用模拟退火法确定MgF₂薄膜折射率和厚度
- Determination of refractive index and thickness of MgF₂ film using simulated annealing algorithm
- 光学精密工程 2013年21卷第4期页码：858-863
- 作者机构：
  
  中国科学院光电技术研究所,四川成都,610209
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20132104.0858
  中图分类号： O484.5
- 收稿日期：2012-08-24，
  
  修回日期：2012-12-14，
  
  网络出版日期：2013-04-20，
  
  纸质出版日期：2013-04-15
- 稿件说明：
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郭春李斌成. 用模拟退火法确定MgF2薄膜折射率和厚度[J]. 光学精密工程, 2013,21(4): 858-863

GUO Chun LI Bin-cheng. Determination of refractive index and thickness of MgF2 film using simulated annealing algorithm[J]. Editorial Office of Optics and Precision Engineering, 2013,21(4): 858-863
郭春李斌成. 用模拟退火法确定MgF2薄膜折射率和厚度[J]. 光学精密工程, 2013,21(4): 858-863 DOI： 10.3788/OPE.20132104.0858.

GUO Chun LI Bin-cheng. Determination of refractive index and thickness of MgF2 film using simulated annealing algorithm[J]. Editorial Office of Optics and Precision Engineering, 2013,21(4): 858-863 DOI： 10.3788/OPE.20132104.0858.

摘要

研究了确定单层MgF

薄膜的物理厚度及其在深紫外/真空紫外波段折射率的方法。首先，利用钼舟热蒸发工艺在B270基底上制备了单层MgF

薄膜。然后，依据MgF

单层膜在不同入射角下的反射光谱，采用模拟退火方法确定了MgF

薄膜在170~260 nm波段的折射率和物理厚度，并与由椭圆偏振法确定的薄膜参数进行了比较。实验显示，采用模拟退火和椭圆偏振两种方法确定的MgF

薄膜厚度分别为248.5 nm和249.5 nm，偏差为0.4%；而用上述两种方法在240~260 nm波段确定的单层MgF

薄膜的折射率偏差均小于0.003。得到的结果证实了依据不同入射角下的反射光谱，用模拟退火方法确定MgF

薄膜厚度和折射率的可靠性。

Abstract

This paper focused on the method to determine the physical thickness of a single-layer MgF

film and its refractive index in the deep ultraviolet/vacuum ultraviolet spectral ranges. The single-layer MgF

film was prepared on the B270 substrate by a Mo boat evaporation method. On the basis of reflectance spectra of the single-layer MgF

film at various incidence angles

the refractive index and thickness of the film in 170-260 nm were determined by the simulated annealing algorithm and were compared with those of determined by ellipsometry. Experimental results indicate that the thicknesses of the MgF

film are 248.5 nm and 249.5 nm by the simulated annealing algorithm and ellipsometry

respectively

which shows a deviation of 0.4%. Moreover

the refractive indexes of the MgF

film at 240-260 nm obtained by two method mentioned above show a deviation less than 0.003. Obtained results prove that the method employing the reflectance spectral and simulated annealing is reliable for determining the refractive index and thickness of the MgF

film.

关键词

Keywords

references

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