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南京航空航天大学 机电学院,江苏 南京,210016
收稿日期:2012-10-25,
修回日期:2012-12-15,
网络出版日期:2013-04-20,
纸质出版日期:2013-04-15
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居志兰 朱永伟 王建彬 樊吉龙 李军. 抛光介质对固结磨料化学机械抛光水晶的影响[J]. 光学精密工程, 2013,21(4): 955-962
JU Zhi-lan ZHU Yong-wei WANG Jian-bin FAN Ji-long LI Jun. Effect of Slurry on Chemical Mechanical Polishing of Decorative Glasses by Fixed-Abrasive Pad[J]. Editorial Office of Optics and Precision Engineering, 2013,21(4): 955-962
居志兰 朱永伟 王建彬 樊吉龙 李军. 抛光介质对固结磨料化学机械抛光水晶的影响[J]. 光学精密工程, 2013,21(4): 955-962 DOI: 10.3788/OPE.20132104.0955.
JU Zhi-lan ZHU Yong-wei WANG Jian-bin FAN Ji-long LI Jun. Effect of Slurry on Chemical Mechanical Polishing of Decorative Glasses by Fixed-Abrasive Pad[J]. Editorial Office of Optics and Precision Engineering, 2013,21(4): 955-962 DOI: 10.3788/OPE.20132104.0955.
在固结磨料化学机械抛光中,工件表面与抛光介质易发生水解反应,产生软化层,而软化层厚度直接影响材料去除速率及表面质量。本文采用显微硬度计测量了不同介质条件下水晶表面的变质层厚度,并基于CP-4研磨抛光平台研究了不同抛光介质及温度对材料去除速率的影响,进而在线测量了抛光过程中声发射信号及抛光垫与工件之间摩擦系数的变化。结果表明:六偏磷酸钠的加入可促进水晶玻璃表层网络结构断裂,软化表层,软化层厚度随着浸泡时间、温度升高而增加,进而提高了水晶玻璃的去除率;而且随着温度升高,水解作用更加明显。实验显示,声发射信号及摩擦系数实时测量对抛光工艺参数的优化具有指导意义。
In chemical mechanical polishing by a fixed-abrasive pad
the hydrolysis between workpiece and slurries will form a softened layer on the glass substrate to effect on the Material Removal Rate (MRR) and surface quality. The influence of polishing slurries on the surface hardness of decorative glass is analyzed by the micro-hardness method in this paper. The effects of different slurries and temperatures on the MRR were investigated using a CP-4 lapping and polishing platform. Both the dynamic Acoustic Emission (AE) and Coefficient of Friction (COF) were continuously monitored in-situ during the polishing process. The results show that the network structure on the decorative glass surface is collapsed when the sodium hexametaphosphate was added to the slurries
and this layer is softer than the glass
which improved the material removal rate. With the temperature increased
the hydrolysis effect is more obviously. Direct real-time monitoring of AE and COF can offer constructive significance for optimizing process parameters of polishing.
OKIHARU K, TOSHIYUKI E. Ultra-flat and ultra-smooth Cu surfaces produced by abrasive-free chemical-mechanical planarization/polishing using vacuum ultraviolet light[J]. Precision Engineering, 2011,35:669-676.[2]MAKOTO S, TETSUYA K,TORU N. Copper polishing with a polishing pad incorporating abrasive grains and a chelating resin [J]. Precision Engineering, 2009,33:167-174.[3]PANDIJA S,ROY D,BABU S V. Chemical mechanical planarization of copper using abrasive-free solutions of oxalic acid and hydrogen peroxide [J]. Materials Chemistry and Physics,2007,102:144-151.[4]王碧玲,高航,滕晓辑,等.抛光加工参数对KDP晶体材料去除和表面质量的影响[J].人工晶体学报.2010,39(1):29-43. WANG B L,GAO H, TENG X J, et al.. Effect of polishing parameter on material removal and surface quality of KDP crystal[J]. Journal of Synthetic Crystals, 2010,39 (1):29-43.(in Chinese)[5]ARUN S, NORM G, MICHAEL V, et al.. In-stiu tribological properties monitoring and chemical mechanical characterization of planarization process[C]. Proceedings of 2004 ASME/STLE international joint tribology conference,2004.[6]SIKDER A K, ASHOK K. Mechanical and tribological properties of interlayer films for the Damascene-Cu chemical-mechanical planarization process [J]. Journal of Electronic Materials. 2002, 31(10):1016-1021. [7]LEE J T,WOO J K,LEE E S. A study on the characteristics of a wafer-polishing process according to machining conditions [J].International Journal of Precision Engineering and Manufacturing, 2009,10(1):23-28.[8]徐驰. 基于摩擦力在线测量的化学机械抛光终点检测技术研究[D].大连:大连理工大学,2011. XU CH. Study on Chemical Mechanical Polishing Endpoint Detection Technology Based on Friction Force Online Measurement[D].Dalian: Dalian University of Technology,2011. (in Chinese)[9]刘玉岭,李薇薇,周建伟. 微电子化学技术基础[M].北京:化学工业出版社,2005. LIU Y L, LI W W, ZHOU J W. Micron Electric Chemical Technology basis[M]. Beijing: Chemical Industry Press ,2005. (in Chinese)[10]罗虹,刘家浚,朱宝亮. 低硬度薄膜厚度的简易检测方法[J].理化检测-物理分册,1994,30(5):49-50. LUO H, LIU J J, ZHU B L. A simple detection method of testing the thickness of low hardness film [J]. Physical Testing and Chemical Analysis Parta Physical Testing: Physical Testing ,1994,30(5):49-50.(in Chinese)[11]王承遇,陶瑛. 玻璃表面处理技术[M].北京:化学工业出版社,2004. WANG C Y, TAO Y. Technology of glass surface treatment [M].Beijing: Chemical Industry Press, 2004. (in Chinese)
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