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同济大学 物理科学与工程学院 精密光学工程技术研究所
收稿日期:2013-01-11,
修回日期:2013-03-15,
网络出版日期:2013-06-20,
纸质出版日期:2013-06-15
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朱京涛 宋竹青 丁涛 马爽 李浩川. 极紫外Mg/SiC、Mg/Co多层膜的稳定性[J]. 光学精密工程, 2013,21(6): 1380-1386
ZHU Jing-tao SONG Zhu-qing DING Tao MA Shuang LI Jie-chuan. Stability of Mg/SiC, Mg/Co EUV multilayers[J]. Editorial Office of Optics and Precision Engineering, 2013,21(6): 1380-1386
朱京涛 宋竹青 丁涛 马爽 李浩川. 极紫外Mg/SiC、Mg/Co多层膜的稳定性[J]. 光学精密工程, 2013,21(6): 1380-1386 DOI: 10.3788/OPE.20132106.1380.
ZHU Jing-tao SONG Zhu-qing DING Tao MA Shuang LI Jie-chuan. Stability of Mg/SiC, Mg/Co EUV multilayers[J]. Editorial Office of Optics and Precision Engineering, 2013,21(6): 1380-1386 DOI: 10.3788/OPE.20132106.1380.
采用磁控溅射法在Si(100)基底上镀制了膜系结构分别为[Mg/Co]
20
、[Mg/SiC]
20
的两组多层膜,以研究Mg基多层膜的稳定性。对放置在室温和80%相对湿度环境下的样品进行显微镜、表面粗糙度和X射线掠入射反射率测试,对比研究了Mg/Co和Mg/SiC两种多层膜结构在相同环境中的损坏状况。对比结果显示:放置4天后,Mg/SiC损坏面积为26.34%,表面粗糙度为10 nm;Mg/Co的损坏面积为2.78%,表面粗糙度为5 nm。6天后,X射线掠入射反射率测量显示Mg/SiC多层膜一级反射峰完全消失,而Mg/Co多层膜的一级反射峰仍有47.63%的反射率。实验表明,Mg/Co多层膜的表面层和内部多层膜结构的损坏速度较Mg/SiC慢,具有较好的环境稳定性。另外,X射线光电子谱(XPS)测试Mg基多层膜损坏后的产物主要为MgCO
3
、Mg(OH)
2
和少量的MgO,且内层Mg(OH)
2
与MgCO
3
含量的比值显著高于表面层。分析认为,水汽是造成Mg基多层膜损坏的主要原因,今后Mg基多层膜保护层的研究可主要针对如何防止水汽进入膜层。
To research the stability of Mg-based multilayers
two groups of multilayers
[Mg/Co]20 and [Mg/SiC]
20
were coated on a Si(100) substrate by magnetron sputtering method. The two samples were tested by a microscopy
a surface roughness experiment and an X-ray grazing incidence reflectivity test at room temperature and a relative humidity of 80%.The contract experiments on multilayer damage for Mg/Co和Mg/SiC were performed in the same condition. The results show that after being exposed in the atmospheric environment for 4 days
the damaged area and surface roughness of the Mg/SiC multilayer sample are up to 26.34% and 10 nm
respectively
while those of the Mg/Co multilayer sample are 2.78% and 5 nm
respectively. After 6 days
the 1st reflection peak of Mg/SiC sample is completely disappeared
and Mg/Co sample still has a peak of 47.63% reflectivity. The experimental results show that the Mg/Co multilayer sample has a better environmental stability as compared with the Mg/SiC multilayer. The X Photoelectron Spectroscopy (XPS) shows that the productions of the damaged Mg-based multilayers are mainly MgCO
3
Mg(OH)
2
and modest MgO. Moreover
the content ratio of Mg (OH)
2
and MgCO
3
in the inner layer is significantly higher than that in the surface layer. Experimental results suggest that the reason for Mg-based multilayer damage is the erosion of H2O(g)
so the capping layer of Mg-based multilayer should prevent the H
2
O(g) penetrating into the mulilayer.
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