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华南理工大学 机械与汽车工程学院,广东 广州,510640
收稿日期:2013-09-20,
纸质出版日期:2014-02-20
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谢晋,刘旭冉,吴可可等. 微磨削锥塔结构光滑表面的自适应方向检测与微加工精度[J]. 光学精密工程, 2014,22(2): 376-382
XIE Jin, LIU Xu-ran, WU Ke-ke etc. Adaptive-orientation measurement and micro-machining accuracy of micro-ground pyramid-structured smooth surface[J]. Editorial Office of Optics and Precision Engineering, 2014,22(2): 376-382
谢晋,刘旭冉,吴可可等. 微磨削锥塔结构光滑表面的自适应方向检测与微加工精度[J]. 光学精密工程, 2014,22(2): 376-382 DOI: 10.3788/OPE.20142202.0376.
XIE Jin, LIU Xu-ran, WU Ke-ke etc. Adaptive-orientation measurement and micro-machining accuracy of micro-ground pyramid-structured smooth surface[J]. Editorial Office of Optics and Precision Engineering, 2014,22(2): 376-382 DOI: 10.3788/OPE.20142202.0376.
用白光干涉检测(WLI)法检测微结构表面形貌时
其光滑结构面和边角数据很容易丢失
因此本文提出了自适应方向WLI检测法。该方法分别沿着每个微斜面法向进行自适应方向检测
评价分析其面形、特征轮廓和特征点的加工精度。首先
采用#3000金刚石砂轮微细尖端在Si表面加工出高度为50 μm、宽度为56 μm且光滑的微锥塔结构。然后
利用四次检测点云对微磨削表面进行拼接与重建。最后
分析面形误差、特征轮廓误差和特征点误差。实验显示:自适应方向WLI检测可以重构出完整的微锥塔结构表面
微磨削的面形误差为5.3 μm
表明该微磨削技术可以确保微锥塔结构光滑Si表面的加工精度。但是
对微锥塔结构表面特征轮廓误差及特征点误差的评价表明
特征轮廓误差高达7.7 μm
而特征点误差约为15 μm
约为面形误差的3倍。分析认为这些误差是由微金刚石砂轮V形尖端磨钝及微磨粒钝化造成的。
When a White Light Interferometry (WLI) is used to measure the micro-structured surface topography
the measured points on smooth micro-structured surfaces and edges are easy to lose. Therefore
an adaptive-orientation WLI was proposed. The method measured each steep surface along its near normal-orientation for the evaluation of its surface shape
feature profile and micro-machining accuracy. First
a #3000 diamond wheel V-tip was employed to fabricate a micro-pyramid-structure Si surface with a depth of 50 μm and a width of 56 μm. Then
four adaptive-orientation measured point clouds were used to splice and reconstruct whole micro-ground surface. Finally
the micro-ground form error
feature profile error and the feature point error were investigated. Experiments show that the adaptive-orientation measurement can reconstruct integrated micro-pyramid-structured surface and the form error is 5.3 μm
which means that the micro-grinding may assure the machining accuracy of micro-pyramid-structured Si surface. In contrast
the evaluation for the feature profiles and feature points of a micro-pyramid-structure indicates that the feature profile error reaches 7.7 μm
and the feature point error is about 15 μm
which is about 3 times of its form error. It suggests that these errors come from the passivations of diamond wheel V-tip and micro grains.
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