干涉法测量双层树脂基材料内部的压缩位移场分布

周延周; 刘运红; 刘羽飞; 徐金雄; 章云

doi:10.3788/OPE.20142211.2923

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干涉法测量双层树脂基材料内部的压缩位移场分布

现代应用光学 | 更新时间：2020-08-13

- 干涉法测量双层树脂基材料内部的压缩位移场分布
- Measurement of compression displacement fields in dual layer epoxy composites by interferometry
- 光学精密工程 2014年22卷第11期页码：2923-2929
- 作者机构：
  
  广东工业大学自动化学院,广东广州,510006
- 作者简介：
- 基金信息：
  
  国家自然科学基金资助项目(No.11072063)();广东省自然科学基金资助项目(No.S2012010010327)()
- DOI：10.3788/OPE.20142211.2923
  中图分类号： TB332;TH744.3
- 收稿日期：2013-11-29，
  
  修回日期：2014-01-11，
  
  纸质出版日期：2014-11-25
- 稿件说明：
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周延周, 刘运红, 刘羽飞等. 干涉法测量双层树脂基材料内部的压缩位移场分布[J]. 光学精密工程, 2014,22(11): 2923-2929

ZHOU Yan-zhou, LIU Yun-hong, LIU Yu-fei etc. Measurement of compression displacement fields in dual layer epoxy composites by interferometry[J]. Editorial Office of Optics and Precision Engineering, 2014,22(11): 2923-2929
周延周, 刘运红, 刘羽飞等. 干涉法测量双层树脂基材料内部的压缩位移场分布[J]. 光学精密工程, 2014,22(11): 2923-2929 DOI： 10.3788/OPE.20142211.2923.

ZHOU Yan-zhou, LIU Yun-hong, LIU Yu-fei etc. Measurement of compression displacement fields in dual layer epoxy composites by interferometry[J]. Editorial Office of Optics and Precision Engineering, 2014,22(11): 2923-2929 DOI： 10.3788/OPE.20142211.2923.

摘要

建立了基于迈克尔逊干涉结构的深度分辨倾斜激光波数扫描干涉测量系统

对双层树脂基复合材料样品的压缩位移场分布进行了测量及分析。首先

采用分布反馈(DFB)半导体激光器对双层树脂基复合材料样品进行波数扫描干涉测量;然后

采用随机采样傅里叶变换(RSFT)计算双层树脂基复合材料样品加载前后的相位差;最后

运用解卷绕算法对材料样品加载前后的相位差进行解卷绕

计算出各表面压缩位移场的分布。实验结果表明

压缩位移场分布的测量精度达到100 nm

深度方向的轮廓分辨率约为0.41 mm

最大测量深度约为52 mm。该方法能够准确测量出树脂基复合材料的压缩位移场分布

测量时不受树脂基复合材料内部切面弹性模量的影响

具有测量精度高

系统稳定

抗干扰能力强等特点。

Abstract

A tilt depth-resolved wavenumber-scanning Michelson interferometer was built up to measure and analyze the compression displacement field distributions on the fore

middle and rear surfaces of dual layer epoxy composites. A Distribution Feedback(DFB) diode laser whose wavenumber could be modulated by the temperature was used to perform the wavenumber-scanning interferometric measurement for the dual layer epoxy composites. A Random-Sampling Fourier Transform (RSFT) was designed to evaluate the phase differences of the dual layer epoxy composite samples before and after applying loads. Finally

the unwrapping algorithm was used to unwrap the phase differences for the samples before and after applying loads and the compression displacement field distributions of every surfaces on or inside the epoxy composites were given out. Experimental results indicate that measurement resolutions of the compression displacement field distribution are 100 nm

and the profile resolution in depth and the maximum measurement depth are 0.41 mm and 52 mm

respectively. This method accurately measures the compression displacement field distribution

and its measurement is independent on the internal plane elastic modulus size of resin matrix composites. It is characterized by higher measuring accuracy

stable system and stronger resisting disturbance.

关键词

Keywords

references

杜善义. 先进复合材料与航空航天[J]. 复合材料学报, 2007, 24(1): 1-10. DU SH Y. Advanced composite materials and aerospace engineering[J]. Acta Materiae Compositae Sinica, 2007, 24(1): 1-10. (in Chinese)

PAN B. Recent progress in digital image correlation[J]. Exp. Mech., 2011, 51(7): 1223-1235.

胡浩,梁晋,唐正宗,等. 数字图像相关法测量金属薄板焊接的全场变形[J]. 光学精密工程, 2012, 20(7): 1637-1640. HU H, LIANG J, TANG ZH Z, et al.. Measurement of full-field deformations in metal sheet welding processes by image correlation method[J]. Opt. Precision Eng., 2012, 20(7): 1637-1640. (in Chinese)

RASTOGI P K. Digital Speckle Pattern Interferometry and Related Techniques[M]. United Kingdom: John Wiley & Sons Ltd., 2001.

ZHOU Y, WILDMAN R D, HUNTLEY J M. Measurement of the mechanical properties of granular packs by wavelength scanning interferometry[J]. Philos. T. R. Soc. A, 2010,466(3): 789-808.

RUIZ P D, HUNTLEY J M. Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry[J]. Applied Optics, 2004(6):679-683.

MANUEL H, de la TORRE-LBARRA, RUIZ P D, at al.. Double-shot depth-resolved displacement field measurement using phase-contrast spectral optical coherence tomography[J]. Optics Express, 2006, 14(21): 9643-9649.

BURLISON B S H, RUIZ P D, HUNTLEY J M. Evaluation of the performance of tilt scanning interferometry for tomographic imaging and profilometry[J]. Optics Communications, 2012,285: 1654-1661.

CHAKRABORTY S, RUIZ P D. Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry[J]. Opt. Soc. Am. A, 2012, 29(9): 1776-1785.

XU J, LIU Y, DONG B, et al.. Improvement of the depth-resolution in the depth-resolved wavenumber-scanning interferometry using multiple uncorrelated wave-number bands[J].Appl. Opt., 2013, 52(20): 4890-4897.

HUNTLEY J M. Noise-immune phase unwrapping algorithm[J]. Appl. Opt., 1989, 28(16): 3268-3270.

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