光学显微线条纹图像中心线提取

李海; 张宪民; 黄沿江; 单译琳

doi:10.3788/OPE.20172505.1340

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光学显微线条纹图像中心线提取

信息科学 | 更新时间：2020-07-07

- 光学显微线条纹图像中心线提取
- Centerline extraction of stripe imaged by optical microscope
- 光学精密工程 2017年25卷第5期页码：1340-1347
- 作者机构：
  
  华南理工大学广东省精密装备与制造技术实验室, 广东广州 510640
- 作者简介：
  
  [ "李海 (1990-), 男, 河南南阳人, 博士研究生, 2013年于中国海洋大学获得学士学位, 现就读于华南理工大学机械与汽车工程学院, 主要从事机器视觉及精密柔顺机构的运动可视化方面的研究。E-mail:hans_haili@163.com" ]
  张宪民 (1964-), 男, 河北涿州人, 教授, 博士生导师, 1993年于北京航空航天大学机电系获得工学博士学位, 现为华南理工大学机械与汽车工程学院院长, 主要从事精密柔顺机构、精密定位系统、机器视觉等方面的研究。E-mail:zhangxm@scut.edu.cn ZHANG Xian-min, E-mail:zhangxm@scut.edu.cn
- 基金信息：
  
  国家自然科学基金资助项目(U1501247);国家自然科学基金资助项目(51605166);国家自然科学基金资助项目(1609206);广东省科技计划资助项目(201604010100);广东省科技计划资助项目(2015B020239001)
- DOI：10.3788/OPE.20172505.1340
  中图分类号： TP394.1
- 收稿日期：2016-09-29，
  
  录用日期：2016-11-29，
  
  纸质出版日期：2017-05-25
- 稿件说明：
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李海, 张宪民, 黄沿江, 等. 光学显微线条纹图像中心线提取[J]. 光学精密工程, 2017,25(5):1340-1347.

Hai LI, Xian-min ZHANG, Yan-jiang HUANG, et al. Centerline extraction of stripe imaged by optical microscope[J]. Optics and precision engineering, 2017, 25(5): 1340-1347.
李海, 张宪民, 黄沿江, 等. 光学显微线条纹图像中心线提取[J]. 光学精密工程, 2017,25(5):1340-1347. DOI： 10.3788/OPE.20172505.1340.

Hai LI, Xian-min ZHANG, Yan-jiang HUANG, et al. Centerline extraction of stripe imaged by optical microscope[J]. Optics and precision engineering, 2017, 25(5): 1340-1347. DOI： 10.3788/OPE.20172505.1340.

摘要

由于接近光学衍射极限，微米尺度线条纹在经过高倍显微镜放大成像后边缘通常都很模糊，加上同轴光源产生的光照不均匀现象，成像质量通常很差。为了有效测量微米尺度线条纹间距，本文提出了一种针对光学显微线条纹图像的中心线提取算法。首先，采用Retinex方法对原图像进行增强，以克服由光照不均匀所造成的无法准确分割的问题。接着，使用Ostu最佳阈值对图像进行二值分割。然后，针对分割后条纹边缘含有大量毛刺和凹陷的现象，使用基于快速步进算法的边缘塌陷法对中心线进行准确提取。最后，对提取中心线进行了最小二乘拟合。实验结果表明：本文提出的方法可以有效实现微米尺度线条纹光学显微图像中心线的准确提取。使用本方法对标准宽度线条纹间距进行实测的最大测量偏差小于2%。

Abstract

Due to the proximity of the optical diffracting limitation

the edges of the stripes in micrometer scale are blurred after magnification by the optical microscope. Together with the uneven illumination caused by coaxial lighting source

the stripe image quality is very poor. To effectively measure the stripe distance between two stripes in micrometer scale

a centerline extraction algorithm was proposed. First

a single scale Retinex model was adopted to enhance the original image to overcome inaccurate segmentation caused by uneven illumination. After that

binary segmentation was conducted on the enhanced image via optimal threshold value of Ostu. Then

directing at the phenomenon that there was much rag and hollow at the boundary of stripes after segmentation

a boundary collapse method based on fast marching algorithm was utilized to extract centerline accurately. Finally

least square fitting method was conducted to fit the extracted centerlines. Experimental results show that the proposed method can effectively realize accurate extraction of stripe centerline in microscopic image with micrometer scale; the maximum measured deviation of this method is less than 2% when it is used for measuring stripe distance between two stripes with standard width.

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references

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