高精度点源透过率杂光测试系统

陈钦芳; 马臻; 王虎; 李欣耀; 庞志海

doi:10.3788/OPE.20172514.0039

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高精度点源透过率杂光测试系统

更新时间：2020-08-13

- 高精度点源透过率杂光测试系统
- High-precision test station for stray light based on point source transmittance
- 光学精密工程 2017年25卷第12z期页码：39-44
- 作者机构：
  
  1. 中国科学院上海技术物理研究所上海,200083
  2. 中国科学院西安光学精密机械研究所, 陕西西安 710119
- 作者简介：
- 基金信息：
  
  国家自然科学基金青年基金资助项目（No.51402351）()
- DOI：10.3788/OPE.20172514.0039
  中图分类号： TH74
- 收稿日期：2017-10-10，
  
  修回日期：2017-10-30，
  
  纸质出版日期：2017-12-31
- 稿件说明：
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陈钦芳, 马臻, 王虎等. 高精度点源透过率杂光测试系统[J]. 光学精密工程, 2017,25(12z): 39-44

CHEN Qin-fang, MA Zhen, WANG Hu etc. High-precision test station for stray light based on point source transmittance[J]. Editorial Office of Optics and Precision Engineering, 2017,25(12z): 39-44
陈钦芳, 马臻, 王虎等. 高精度点源透过率杂光测试系统[J]. 光学精密工程, 2017,25(12z): 39-44 DOI： 10.3788/OPE.20172514.0039.

CHEN Qin-fang, MA Zhen, WANG Hu etc. High-precision test station for stray light based on point source transmittance[J]. Editorial Office of Optics and Precision Engineering, 2017,25(12z): 39-44 DOI： 10.3788/OPE.20172514.0039.

摘要

空间光学对深空暗弱目标探测的迫切需求以及低探测阈值探测器的快速发展，对光学系统杂散光的抑制能力及测试验证水平提出了更高的要求。本文研制了一套点源透过率杂光测试系统，测试系统口径达1 m，测试波段覆盖可见到长波红外，转台方位角为±110°，俯仰角为±15°；整个测试系统空间为全封闭的暗室，尺寸达到28 m×8 m×9 m。为有效抑制测试系统的光污染，采用表面粗糙度低于2 nm的主镜来降低镜面散射引入的光污染；采用双柱罐形状的测试腔引导内壁反射光将其进行衰减；采用高洁净度测试环境抑制空气中的颗粒散射。试验和分析结果表明，该系统在可见光波段的PST测试阈值达到10

-7

，红外波段的PST测试阈值可达到10

-6

，系统测试精度达到|lg（测试值/真实值）|≤0.5。

Abstract

The increased demand for detection of dim targets in deep space and the rapid development of low threshold space-based sensors have required greater suppression performance of stay light and higher test accuracy. A stray light test station based on Point Source Transmittance (PST) is built. The station allows an measuring aperture up to 1 m and waveband from the visible to the infrared. In the station

the turntable instrument is allowed to scan ±110° in azimuth

and ±15° in picth. The test station is all black with dimensions of 28 m×8 m×9 m. In order to control light scattered from the collimator

the primary mirror with less than 2 nm RMS roughness is manufactured. A double cylindrical chamber is employed to direct and attenuate the scattered light from the system. In addition

a clean room in 1 000 class is utilized to filter air to reduce light scattered from particles in the air. Analysis and measurements show that the test station can measure point PST as low as 10

-7

at visible wavelengths

and 10

-6

at infrared wavelengths. Its test accuracy|lg(measurement value/true value)|is less than 0.5.

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references

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