角度位置自动识别的红外折射率测量

刘永兴; 张培晴; 吴越豪; 胡向平

doi:10.3788/OPE.20182602.0300

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角度位置自动识别的红外折射率测量

现代应用光学 | 更新时间：2020-07-05

- 角度位置自动识别的红外折射率测量
- Measurement of infrared refractive index based on angle location automatic recognition
- 光学精密工程 2018年26卷第2期页码：300-306
- 作者机构：
  
  1.宁波大学高等技术研究院红外材料及器件实验室, 浙江宁波 315211
  2.湖北新华光信息材料有限公司, 湖北襄阳 441000
  3.浙江省光电探测材料及器件重点实验室, 浙江宁波 315211
- 作者简介：
  
  [ "刘永兴(1987-), 男, 湖北利川人, 博士研究生, 2010年、2013年于宁波大学分别获得学士、硕士学位, 主要从事新型红外光子器件方面的研究。E-mail:liuyongxing@nbu.edu.cn" ]
- 基金信息：
  
  国家重点研发计划资助项目(2016YFB0303800);国家基金委重大科学仪器项目(61627815);宁波大学王宽诚幸福基金
- DOI：10.3788/OPE.20182602.0300
  中图分类号： TN216
- 收稿日期：2017-06-27，
  
  录用日期：2017-8-22，
  
  纸质出版日期：2018-02-25
- 稿件说明：
移动端阅览
刘永兴, 张培晴, 吴越豪, 等. 角度位置自动识别的红外折射率测量[J]. 光学精密工程, 2018,26(2):300-306.

Yong-xing LIU, Pei-qing ZHANG, Yue-hao WU, et al. Measurement of infrared refractive index based on angle location automatic recognition[J]. Optics and precision engineering, 2018, 26(2): 300-306.
刘永兴, 张培晴, 吴越豪, 等. 角度位置自动识别的红外折射率测量[J]. 光学精密工程, 2018,26(2):300-306. DOI： 10.3788/OPE.20182602.0300.

Yong-xing LIU, Pei-qing ZHANG, Yue-hao WU, et al. Measurement of infrared refractive index based on angle location automatic recognition[J]. Optics and precision engineering, 2018, 26(2): 300-306. DOI： 10.3788/OPE.20182602.0300.

摘要

为准确快速获得块体硫系玻璃红外波段的折射率，搭建了基于类准直测量法的折射率测量系统。该系统采用液氮制冷的碲镉汞探测器和特殊的光路实现了光强信息的高分辨采集，使用高分辨数据采集卡将角度信息数字化，利用精密步进电机传动控制系统实现了光强信号与位置信号的同步记录。开发的测量软件可自动判别光强峰位信息，自动计算获得待测样品的折射率。对比测试Ge

、Ge

、As

和As

商用硫系玻璃在3.39

m和4.8

m处的折射率。实验结果表明，该装置系统测量折射率的标准偏差为10

-3

，测量不确定度为0.002 9，可快速、准确测量块体材料红外波段的折射率。

Abstract

In order to determine the refractive index of bulk glasses in the infrared band

a refractive index measurement system based on the optical auto-collimation principle is proposed. We use a liquid-nitrogen-cooled mercury telluride detector and a special optical architecture to collect high-resolution light intensity information. The angle information is converted to digital information by a data acquisition card. A precision stepper motor drive control system is used to synchronize the light intensity signal and the position signal. The software automatically determines the peak position of the light intensity

and automatically calculates the refractive index of the sample. The refractive indices of the Ge

and As

commercial chalcogenide glasses were measured at 3.39

m and 4.8

m. The standard deviation of the refractive index measurement system is 10

-3

with a measurement uncertainty of 0.002 9. The system can be useful to quickly and accurately measure the refractive index of bulk materials in the infrared band.

关键词

Keywords

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