无线控制式原子力显微镜系统

章海军; 陈佳骏; 王英达; 尤清扬

doi:10.3788/OPE.20182609.2205

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无线控制式原子力显微镜系统

更新时间：2020-08-13

- 无线控制式原子力显微镜系统
- Development of wirelessly controlled atomic force microscope
- 光学精密工程 2018年26卷第9期页码：2205-2211
- 作者机构：
  
  浙江大学光电科学与工程学院现代光学仪器国家重点实验室, 浙江杭州 310027
- 作者简介：
  
  [ "章海军(1965-), 男, 浙江新昌人, 教授, 博士生导师, 1993年于浙江大学获得博士学位, 主要从事光学工程及原子力显微镜技术的研究。E-mail:zhanghj@zju.edu.cn" ]
  [ "陈佳骏(1994-), 男, 浙江东阳人, 硕士研究生, 2016年于浙江大学获得学士学位, 主要从事原子力显微镜技术及系统的研究。E-mail:21630060@zju.edu.cn" ]
- 基金信息：
  
  国家自然科学基金资助项目(51077117);国家自然科学基金资助项目(61540019)
- DOI：10.3788/OPE.20182609.2205
  中图分类号： TH742
- 收稿日期：2018-02-05，
  
  录用日期：2018-3-14，
  
  纸质出版日期：2018-09-25
- 稿件说明：
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章海军, 陈佳骏, 王英达, 等. 无线控制式原子力显微镜系统[J]. 光学精密工程, 2018,26(9):2205-2211.

Hai-jun ZHANG, Jia-jun CHEN, Ying-da WANG, et al. Development of wirelessly controlled atomic force microscope[J]. Optics and precision engineering, 2018, 26(9): 2205-2211.
章海军, 陈佳骏, 王英达, 等. 无线控制式原子力显微镜系统[J]. 光学精密工程, 2018,26(9):2205-2211. DOI： 10.3788/OPE.20182609.2205.

Hai-jun ZHANG, Jia-jun CHEN, Ying-da WANG, et al. Development of wirelessly controlled atomic force microscope[J]. Optics and precision engineering, 2018, 26(9): 2205-2211. DOI： 10.3788/OPE.20182609.2205.

摘要

提出了一种基于嵌入式系统和WiFi无线控制的接触模式原子力显微镜（AFM）系统。该AFM系统直接由迷你型移动电源给扫描与反馈电路及嵌入式系统等供电；嵌入式系统由微型电脑树莓派和微小型AD

DA模块构成，通过WiFi与笔记本电脑实现无线数据通信。利用这一方法，成功研发了无线控制式AFM系统，并开展了微纳米样品的扫描成像实验。实验结果表明，该AFM系统的横向分辨率达到纳米量级，纵向分辨率达到0.1 nm，最大扫描范围为3.6

m×3.6

m。该系统的显著特点是无需交流市电供电，无需直流高压电源，也无需与计算机之间的线缆连接，可在约100 m远处通过无线控制的方式实现AFM的扫描成像。这一新型AFM系统，不仅能够在微纳米技术的常规领域得到应用，而且在野外考察、隔离环境、真空条件、气体氛围环境及星际探测等特殊领域具有广阔的应用前景。

Abstract

This paper proposes a contact mode Atomic Force Microscope (AFM) based on an embedded system and WiFi control. This AFM utilizes a portable power supply to drive the scanning/feedback circuit and an embedded system. The embedded system

which consists of a micro-computer (Raspberry Pi) and a micro AD & DA module

realizes WiFi-based communication with a laptop computer. Using this approach

a wirelessly controlled AFM is developed and experiments are performed using different samples. The results indicate that the horizontal resolution of the AFM is in nanometer order

and vertical resolution is 0.1 nm. Furthermore

the AFM can achieve a maximum scan range of 3.6 m×3.6 m. The advantages of the proposed setup include the circumvention of the need for commercial and high-voltage DC power supplies

and the obviation of a cable connection between the embedded system and the laptop computer. The system is capable of realizing AFM scanning and imaging via wireless control at approximately 100 m away. This AFM can be potentially applied in most micro/nano-technology fields. Moreover

it allows for special applications in outdoor investigations

isolated spaces

vacuum conditions

gas environments

and even interstellar exploration.

关键词

Keywords

references

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