基于多项式拟合的中阶梯光栅光谱仪谱图还原

朱继伟; 孙慈; 杨晋; 马婷婷; 郭雪强; 张健

doi:10.3788/OPE.20202808.1627

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基于多项式拟合的中阶梯光栅光谱仪谱图还原

现代应用光学 | 更新时间：2020-08-14

- 基于多项式拟合的中阶梯光栅光谱仪谱图还原
- Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting
- 光学精密工程 2020年28卷第8期页码：1627-1633
- 作者机构：
  
  1.长春长光格瑞光电技术有限公司, 吉林长春 130102
  2.中国科学院长春光学精密机械与物理研究所, 吉林长春 130033
- 作者简介：
  
  [ "朱继伟(1980-), 男, 吉林人, 博士, 副研究员, 现为长春长光格瑞光电技术有限公司总经理, 主要从事光谱仪器设计开发及光谱分析技术等方面的研究。E-mail:zjw1980320@126.com" ]
  孙慈(1988-), 女, 内蒙古人, 硕士, 研究实习员, 主要从事光谱仪器设计与开发方面的研究。E-mail:sunci1822@163.comSUN Ci, E-mail:sunci1822@163.com
- 基金信息：
  
  国家重大科学仪器设备开发专项(2018YFF01011102);国家重大科学仪器设备开发专项(2014YQ120351);国家重大科研装备研制项目(ZDYZ2008-1);吉林省重大科技攻关项目(09ZDGG005);国家自然科学基金资助项目(61805240);吉林省科技发展计划资助项目(20180201049SF);吉林省科技发展计划资助项目(20180201123GX);吉林省科技发展计划资助项目(20180201122GX);长春市科技计划资助项目(18DY003)
- DOI：10.3788/OPE.20202808.1627
  中图分类号： O433;TH744.1
- 收稿日期：2019-12-25，
  
  修回日期：2020-01-09，
  
  录用日期：2020-1-9，
  
  纸质出版日期：2020-08-15
- 稿件说明：
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朱继伟, 孙慈, 杨晋, 等. 基于多项式拟合的中阶梯光栅光谱仪谱图还原[J]. 光学精密工程, 2020,28(8):1627-1633.

Ji-wei ZHU, Ci SUN, Jin YANG, et al. Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting[J]. Optics and precision engineering, 2020, 28(8): 1627-1633.
朱继伟, 孙慈, 杨晋, 等. 基于多项式拟合的中阶梯光栅光谱仪谱图还原[J]. 光学精密工程, 2020,28(8):1627-1633. DOI： 10.3788/OPE.20202808.1627.

Ji-wei ZHU, Ci SUN, Jin YANG, et al. Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting[J]. Optics and precision engineering, 2020, 28(8): 1627-1633. DOI： 10.3788/OPE.20202808.1627.

摘要

为了基于中阶梯光栅光谱仪特殊的二维原始光谱图像实现各波长与其强度信息的一一对应，进而得到可以直接读取所需波段或波长光信号强度信息的一维光谱曲线。对其原始光谱进行分析研究，通过获得接收像面上各波长光斑位置与探测器像元的精确对应关系，实现谱图的还原处理。采用多项式拟合方法分别对中阶梯光栅光谱仪的棱镜色散方向和光栅色散方向上光斑的位置坐标进行拟合，建立起波长与像面之间的关系式，为减小光线追迹数量，同时采用级次间拟合的方式建立谱图还原模型。实验结果表明：通过该方法，可实现快速、高精度的谱图还原模型建立，模型的计算误差最大为0.023 92 mm，即谱图还原精度优于1个像元。该算法具有较强的灵活性和普适性，适用于各类中阶梯光栅光谱仪的谱图还原模型计算。

Abstract

To realize the one-to-one correspondence between each wavelength and its intensity information based on the original two-dimensional spectrogram measured by an echelle grating spectrometer

it is necessary to obtain a one-dimensional spectral curve from which the optical signal intensity as a function of wavelength can be read directly.The original spectrogram is analyzed and the accurate correspondence between the position of each wavelength spot on the receiving image surface and the detector pixel is obtained to realize the reduction processing of the spectrogram.A polynomial fitting method was used to fit the position coordinates of the wavelength spots on the dispersion direction of the prism and the grating

thus establishing the relationship between the wavelength and the image surface.Experimental results show that the polynomial fitting method can be used to establish a spectrogram reduction model rapidly and accurately

achieving spectrogram reduction accuracy of better than 1 pixel as indicated by the maximum computational error of the model (0.023 92 mm).The proposed algorithm has strong flexibility and universality

making it suitable for calculating the spectrogram reduction model for a variety of echelle grating spectrometer designs.

关键词

Keywords

references

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