WANG Chen,WANG Zizheng,LIU Zhaoran,et al.Low signal-to-noise ratio spectral interferometry film thickness measurement based on self-attention neural network[J].Optics and Precision Engineering,2025,33(09):1341-1352.
WANG Chen,WANG Zizheng,LIU Zhaoran,et al.Low signal-to-noise ratio spectral interferometry film thickness measurement based on self-attention neural network[J].Optics and Precision Engineering,2025,33(09):1341-1352. DOI: 10.37188/OPE.20253309.1341. CSTR: 32169.14.OPE.20253309.1341.