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Issue 5 ， 1991
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Optical System of Color Image Decoder
Abstract：The color image decoder is designed by means of professor Mu Guoguang's new idea which is a novel technology recording and displying color image with black and white film. This novel technology consists of a encoding camera and color image decorder. This paper described the choice of the technical parameters of the optical systems in the color image decorder from the viewpoint of the general design of the whole instrument and the characteristics in optical design.- 44
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Published：2020-08-12 -
Determination of the Center Error Tolerence of the Tracing and Measuring Zoom System
Abstract：This paper presents a method to determine the center error tolerence of the component in zoom system according to the transverse image displacement tolerence, by comparing the result from this method with that from the center-coma tolerence, in order to provide some reference basis to determine the center error tolerence of the component in tracing and measuring zoom system.- 36
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Published：2020-08-12 -
Reactive Ionized-cluster Beam Technique for Optical Films Deposition
Abstract：The principle of the ionized-cluster beam(ICB) technique and the main characteristics of optical films deposited by ICB are described. ICB deposition apparatus has been fabricated. The films of ZnS and MgF2 at low substrate temperatures deposited by ICB become hard films. The optical film of ZnO has preferentical orientation. The optical film of SiO2 has polycrystalline strueture.- 39
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Published：2020-08-12 -
The Calculation Method of Space Electric-field Distribution in Resistance Laser Multilayers
Abstract：In reports a new complefe method for calculating the field intensity of laser multilayer in this paper. An important property of this method is that it does not need to calculate the reflection and transmissivity of each interface. And using this method not only the plane freld intensity, but also the space field distribution of multilayer can be found. This method is simple and can be commonly used.Keywords：Resistance Laser Multilayer;Field-distribution- 25
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Published：2020-08-12 -
Improved Henke Ultra-soft X-ray Source
Abstract：In this paper the construction characteristic and the electron-optical character of the improved Henke ultrasoft X-ray source are presented. Many improvements on the basis of the Henke source have been done in the new improved one. For the first time the double cathodes and four focus lines stracture are adopted. The spatial distrubution of radiative intensity is effectively improved and flattened by the rational allocation of four focus lines. A new cathode (LaB6)takes the place of tungsten filement, which reduce input power and raises cathode emiting efficiency. In addition the target voltage formula of radiation intensity maximum is derived for the normal incidence of the electron beam. The characteristic line spectra of Alkα, Cu-lα1α2, B-kα and Be-kα are calculated by use of this formula. The calculation results accord with the Henke's measurment results.- 35
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Published：2020-08-12 -
An Automatic System Used to Measure Volumes of Large Heaps of Coal
Abstract：An automatic system used to measure valumes of large heaps of coal is described in detail in this paper. The scanning detection system composed of scanning vehicle, laser and camera divides large heaps of coal into a number of small areas and measures the heights of each small area and then computs the integrating volume. using scanning control, data sampling and processing, and single chip microprocessor. The measuring error of the system is approximately 1%.- 33
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Published：2020-08-12 -
Coupling of Fiber-associated with an S-shaped Transition Strip Waveguide
Abstract：This paper describes the influence of fabrication parameters on fiber-Ti:LiNbO3 waveguide. We fabricated Tidiffusion waveguide with 6μm wide strip(associated with an S-shaped transition),and 600A,750A,950A,1100A thicknesses at 1025℃ for 9 hour constant temperature. We have measured fiber-waveguide (2.3cm) -fiber insertion loss, showing that at λ=1.33μm and 950 thick with 6μm wide strip of Ti at 1025℃ for 9 hour constant temperature the loss is minimum.- 46
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Published：2020-08-12 -
Types of Guide Devices of the Zoom Lenses
Abstract：This paper classifies and studies the guide devices of the zoom lenses as the important part of the zoom lens.- 61
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Published：2020-08-12 -
The Investigation of Binding Strength Between Laser Cladding G112. Alloy and Substrate of Steel A3
Abstract：A G112 alloy layer with excellent performence is clad on the surface of steel A3 by using high-power laser.Their binding strength is most important standard for evaluating quality of cladding layer. In this paper, the binding strength between the clad layer and substrate steel A3 is mainly researched by a measuring method. The results showed that the metallurgical binding strength between them is lager than 0112 alloy strenth for extension and over 90 MN/m2.- 46
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Published：2020-08-12 -
Optical Multiple-value Operation Based on Symbolic Substitution
Abstract：A method of optical multiple-value operation based on symbolic substitution rule is presented. The experimental results of two.ternary 3?3 matrixs are given.- 33
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Published：2020-08-12 -
A Study on Single-chip Computer in the Application of Hydraulic Control System
Abstract：The paper presents a digital hydraulic control system composed of single-chip computer with a new type of digital valve, it makes use of grating ruler as transducer without A/D, D/A converter, and therefore, it possesses many advantages, such as simple construction, low price, easy to develop product series and convenient to popularize. It can reach control object quickly without vibration,so is extremely suitable for industrial control such as machine tool of low frequency response.- 42
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Published：2020-08-12 -
The Measurement of Soft X-ray Supper Thin Film by Means of the Wide Angle Diffractometer
Abstract：The measurement of soft X-ray supper thin film by means of diffractometer is the most common method employed abroad, but usually is limited to double crystal or small angle diffractometer. This paper intruduce a method, which solved the problem of diffraction peak shift and diffraction curve lossing due to the locating error of the sample when the wide angle diffractometer is used at low angle range, so that the wide angle diffractometer can be used in the small angle range. The paper emphasizes the analyses of the measurement results and the corparison of the experimental and theoretiod results, based on the calculating period of multilayered coatings and the thickness of single layer coatings. The measurement results of the thickness by means of wide angle diffraction are very believable and reliable. At present, the equipment for reflectance measurement in the soft X-ray spectral range has not been developed perfectly,the measurement of soft X-ray supper thin film by means of X-ray diffractometer seems to be more important.- 28
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Published：2020-08-12
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