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High-speed dynamic focus tracking and error compensation for wafer laser stealth dicing
Micro\/Nano Technology and Fine Mechanics | Updated:2026-10-20
    • High-speed dynamic focus tracking and error compensation for wafer laser stealth dicing

    • “Researchers have proposed a focus dynamic tracking and error compensation method based on laser triangulation, which adopts a two-level compensation architecture combining offline static calibration and online dynamic correction. The trajectory tracking error is optimized from ± 3.5 μ m to ± 0.50 μ m, providing a solution for high-speed and high-precision invisible cutting of high-end ultra-thin wafers.”
    • DONG Dai , SUN Hu , CUI Jianhua , SONG Yajun , ZHAO Huining , XIA Haojie
    • Optics and Precision Engineering Vol. 34, Issue 19, Pages: 3056-3068(2026)
    • DOI: 10.3724/OPE.20263419.3056     

      CLC:
    • CSTR: 32169.14.OPE.20263419.3056     
    • Revised:2026-07-24 ,

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